Equipment

Accurate Surface Topography Sub-nanometer vertical resolution-All magnifications Motorized, programmable stage/Stitching Large area measurements Optical Profiling System non-contact 3D surface Metrology, dual-LED illumination, 2D/3D data analysis and visualization. Objectives standard 5X,10X,20X,50X. Motorized turret. Magnification from .75X to 100X. Field of view 0.55x, 0.75x, 1x, 1.5x, 2x. Automated 100mm Z-axis, +/- 6 degree tip/tilt stage. 100mm XY…

The KLA Candela Optical Surface Analyzer (OSA) 5100 is a semiconductor and photovoltaic wafer metrology system that analyzes surface properties like thickness, uniformity, and texture using advanced optical techniques

The Veeco NT1100 optical profiler is a non-contact 3D surface metrology system that uses white light interferometry to measure surfaces with sub-nanometer roughness to millimeter-high steps. It offers two measurement modes (VSI and PSI) with different resolutions and ranges, and a variety of objectives are available for different magnifications. 

The Dektak 150 is a surface profiler with a 150mm (6-inch) maximum sample size, a 55mm scan length, and a vertical resolution of 1 Ångström (10-1010 to the negative 10 power m) at its best. It uses a contact stylus to measure surface roughness and step heights, with a vertical range of up to 524…

The Quesant 250 AFM (Atomic Force Microscope) is a surface imaging system with specifications including a 6″ x 6″ maximum sample stage, a 65 mm maximum sample height, and a motorized Z-translation stage. It features an integrated 200X video microscope for sample viewing.

Veeco/Wyko NT2000 is an automated optical surface profiler designed for semiconductor manufacturing that uses non-contact interferometry for 3D surface topography measurement.